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The Best Solution To Verify Your Transport Applications


FOR CARD AND READERS USED IN FARE COLLECTION APPLICATIONS, KEOLABS PROVIDES OFF-THE-SHELF SOLUTIONS TO VERIFY CONFORMITY TO RELEVANT TRANSPORT STANDARDS.

The European Committee for Standardization CEN/TS 16794-2 is the European testing standard for functional validation of contactless (ISO/IEC 14443) fare management systems terminals and fare media used in public transport. Moreover, OSPT Alliance defined a test specification for application-level called CIPURSE.

Used By The best transport Operators

KEOLABS’ CEN/TS 16794-2 Analog & Digital Testing Solutions are available to users for “in house” evaluation of their products during development before engaging in a formal certification. CEN/TS 16794-2 specifies conformance verification standards to ensure the ISO/IEC 14443 interoperability between a card/ticket and a reader.

The CIPURSE open standard provides an advanced foundation for developing highly secure, interoperable, and flexible transit fare collection solutions. It is built on proven standards, including ISO/IEC 7816, AES-128 and ISO/IEC 14443 for securing multiple payment types.

SCRIPTIS: an intuitive testing environement

SCRIPTIS™ software is a complete, open and simple testing environment. It runs on the user’s PC and allows easy control of a range of software/hardware solutions designed for testing conformance of smart cards, card readers, related components and systems in accordance with relevant industry standards.

KEOLABS’ test suites are used in SCRIPTIS™ testing environment which facilitates testing with automation features such as visual cues and aids for manual testing, or robot integration for fully automated testing. SCRIPTIS provides full visibility of test results including logs and traces of communications between the test bench and the tested device.

 

 

Technical Characteristics
License Options
Hardware Components

 

PCD ANALOG CEN/TS 16794-2 TEST SUITE / PCD ANALOG ISO 10373-6 TEST SUITE

This PCD Analog test suite is compatible with the following standard:

ISO/IEC 10373-6:2016 standard for Type A and Type B 

ISO/IEC CEN/TS 16794-2:2017 standard.

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC 10373-6:2016):

ISO/IEC 14443-1 parameters tests

  • §6.1.1 Alternating magnetic field test

 

ISO/IEC 14443-2 parameters tests

  • §7.1.1 – PCD field strength
  • §7.1.4 – Modulation index and waveform
  • §7.1.5 – Load modulation reception
  • §7.1.6 – PCD EMD immunity test
  • §7.1.7 – PCD EMD recovery test

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC CEN/TS 16794-2:2017):

  • §6.2.2 – TC_PCD_A_MaxFS: PCD maximum field strength
  • §6.2.3 – TC_PCD_A_MinFS: PCD minimum field strength
  • §6.2.4 – TC_PCD_A_ALF: Alternating magnetic field
  • §6.3.1 – TC_PCD_TAMW: Type A modulation waveform
  • §6.3.2 – TC_PCD_TBMW: Type B modulation index and waveform
  • §6.4.1 – TC_PCD_A_TALMR: Type A load modulation reception
  • §6.4.2 – TC_PCD_A_TALMR: Type B load modulation reception
  • §6.5.2 – TC_PCD_A_TAEI: Type A EMD immunity
  • §6.5.3 – TC_PCD_A_TBEI: Type B EMD immunity
  • §6.5.4 – TC_PCD_A_TAER: Type A EMD handling timing constraints
  • §6.5.5 – TC_PCD_A_TBER: Type B EMD handling timing constraints

 

 

PCD DIGITAL CEN/TS-16794-2 TEST SUITE / PCD DIGITAL ISO 10373-6 TEST SUITE

The PCD digital test suite is compatible with the following standard:

ISO/IEC 10373-6:2016 standard for Type A and Type B 

ISO/IEC CEN/TS 16794-2:2017 standard

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC 10373-6:2016):

Type A specific tests

  • §H.2.1 – Frame Delay Time PICC to PCD ISO/IEC
  • §H.2.2 – Request Guard Time
  • §H.2.3 – Handling of bit collision during ATQA
  • §H.2.4 – Handling of anti-collision loop
  • §H.2.5 – Handling of RATS and ATS
  • §H.2.6 – Handling of PPS response
  • §H.2.7 – Frame size selection mechanism
  • §H.2.8 – Handling of Start-up Frame Guard Time
  • §H.2.9 – Handling of the CID during activation by the PCD

 

Type B specific tests

  • §H.3.1 – I/O transmission timing
  • §H.3.2 – Frame size selection mechanism
  • §H.3.3 – Handling of the CID during activation by the PCD

 

Type A and Type B logical operations tests:

  • §H.4.1 – Handling of the polling loop
  • §H.4.2 – Reaction of the PCD to request for waiting time extension
  • §H.4.3 – Error detection and recovery
  • §H.4.4 – Handling of NAD during chaining

 

High bit rate selection tests

  • §I.2.1 – Procedure for Type A
  • §I.2.2 – Procedure for Type B
  • §I.2.3 – Procedure for bit rate selection using S(PARAMETERS) blocks

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC CEN/TS 16794-2:2017):

  • §8.3.1 – TC_PCD_D_TADT: PCD Type A detection time
  • §8.3.2 – TC_PCD_D_TBDT: PCD Type B detection time
  • §8.3.3 – TC_PCD_D_AFI: PCD AFI value sent by the PCD
  • §8.3.4 – TC_PCD_D_ATQB: PCD extended ATQB option
  • §8.3.5 – TC_PCD_D_RFU: Recommendations on RFU bits and values reception test
  • §8.3.6 – TC_PCD_D_PRO: Proprietary protocols management by the PCD
  • §8.3.7 – TC_PCD_D_TAMF: ATQA sent after modulated field
  • §8.3.8 – TC_PCD_D_TBMF: ATQB sent after modulated field

PICC ANALOG CEN/TS 16794-2 TEST SUITE / PICC ANALOG ISO 10373-6 TEST SUITE

This PICC Analog test suite is compatible with the following standard:

ISO/IEC 10373-6:2016 standard for Type A and Type B 

ISO/IEC CEN/TS 16794-2:2017 standard

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC 10373-6:2016):

ISO/IEC 14443-1 parameters tests

  • §6.2.1 – Alternating magnetic field

 

ISO/IEC 14443-2 parameters tests

  • §7.2.1 – PICC transmission
  • §7.2.2 – PICC EMD level and low EMD time test (VHBR not supported)
  • §7.2.3 – PICC reception
  • §7.2.4 – PICC resonance frequency
  • §7.2.5 – PICC maximum loading effect

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC CEN/TS 16794-2:2017):

  • §7.2.1 – TC_PICC_A_OFS: PICC operating field strength (performed at 106kbps, 212kbps, 424kbps, 847kbps, 1.7Mbps, 3.4Mbps and 6.8Mbps)
  • §7.2.2 – TC_PICC_A_LMA: PICC transmission (performed at 106kbps, 1.7Mbps, 3.4Mbps and 6.8Mbps)
  • §7.2.3 – TC_PICC_A_RCPT: PICC reception (performed at 106kbps, 212kbps, 424kbps, 847kbps, 1.7Mbps, 3.4Mbps and 6.8Mbps)
  • §7.2.4 – TC_PICC_A_LDE: PICC maximum loading effect
  • §7.2.5 – TC_PICC_A_EMD: PICC EMD level and low EMD time (performed at 106kbps)
  • §7.2.6 – TC_PICC_A_ALF: Alternating magnetic field (performed at 106kbps)

 

 

PICC DIGITAL CEN/TS 16794-2 TEST SUITE / PICC DIGITAL ISO 10373-6 TEST SUITE

This PICC Digital test suite is compatible with the following standard:

ISO/IEC 10373-6:2016 standard for Type A and Type B 

ISO/IEC CEN/TS 16794-2:2017 standard.

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC 10373-6:2016):

Type A initialization tests

  • §G.3.2 – Scenario G.1 Polling Type A
  • §G.3.3 – Testing of the PICC Type A state transitions
  • §G.3.4 – Handling of Type A anti-collision
  • §G.3.5 – Handling of RATS
  • §G.3.6 – Handling of PPS request
  • §G.3.7 – Handling of FSD

 

Type B initialization tests

  • §G.4.2 – Scenario G.1 Polling Type B
  • §G.4.3 – Scenario G.22: PICC Reception
  • §G.4.4 – Testing of the PICC Type B state transitions
  • §G.4.5 – Scenario G.28: Handling of Type B anticollision
  • §G.4.6 – Handling of ATTRIB
  • §G.4.7 – Scenario G.31: Handling of Maximum Frame Size

 

Type A or type B logical operation tests

  • §G.5.2 – PICC reaction to ISO/IEC 14443-4 Scenarios
  • §G.5.3 – Handling of PICC error detection
  • §G.5.4 – PICC reaction on CID
  • §G.5.5 – PICC reaction on NAD
  • §G.5.6 – PICC reaction on S(PARAMETERS) blocks

 

Our coverage of this test specification includes the following test cases (numbering according to the ISO/IEC CEN/TS 16794-2:2017):

  • §9.3.1 – TC_PICC_D_ATQB: PICC support of REQB/WUPB allowing extended ATQB
  • §9.3.2 – TC_PICC_D_RFU: Recommendations on RFU bits and values reception test
  • §9.3.3 – TC_PICC_D_RAMP: field ramp-ups and shut-offs

PICC APPLICATION CIPURSE TEST SUITE

This application test suite is compatible with the following standard: CIPURSE test specification established by the Open Standard for Public Transportation Alliance (OSPT)

 

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